---
product_id: 59748584
title: "Thin Film Analysis by X-Ray Scattering: Techniques for Structural Characterization Hardcover – 15 Nov 2005"
brand: "mario birkholz"
price: "47712 kr"
currency: ISK
in_stock: true
reviews_count: 1
category: "Books"
url: https://www.desertcart.is/products/59748584-thin-film-analysis-by-x-ray-scattering-techniques-for-structural
store_origin: IS
region: Iceland
---

# Thin Film Analysis by X-Ray Scattering: Techniques for Structural Characterization Hardcover – 15 Nov 2005

**Brand:** mario birkholz
**Price:** 47712 kr
**Availability:** ✅ In Stock

## Quick Answers

- **What is this?** Thin Film Analysis by X-Ray Scattering: Techniques for Structural Characterization Hardcover – 15 Nov 2005 by mario birkholz
- **How much does it cost?** 47712 kr with free shipping
- **Is it available?** Yes, in stock and ready to ship
- **Where can I buy it?** [www.desertcart.is](https://www.desertcart.is/products/59748584-thin-film-analysis-by-x-ray-scattering-techniques-for-structural)

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## Description

Review
        	  
        	  
        		  
        			&quot;... this book should prove very useful to anyone...&quot; Material Characterization
				    	
			    	
        		  
        		  
        	
          
              
        	  	  Synopsis 
        	  
        	  
        		  
        			With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
				    	
			    	
        		  
        		  
        	
          
              
        	  	  From the Back Cover
        	  
        	  
        		  
        			While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
				    	
			    	
        		  
        		  
        	
          
              
        	  	  About the Author
        	  
        	  
        		  
        			Dr. Mario Birkholz was born 1958 in Hamburg, Germany. He studied physics at the Free University of Berlin and completed his diploma thesis on structural investigations of biological membranes in 1986, and obtained his Ph.D. on the structure of stoichiometry deviations in iron-pyrite in 1990. Research positions at Hahn-Meitner-Institut Berlin, at Fraunhofer Institute for Thin Film and Surface Technology, Braunschweig, and at IHP Microelectronics, Frankfurt (Oder), followed. He is involved in the development of thin film systems for applications in photovoltaics, sensor technology and as protective coatings. His main scientific interest is focused on the structure and morphology of thin films, their investigation by x-ray scattering techniques and the relation between structure and function.

## Images

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## Customer Reviews

### ⭐⭐⭐⭐⭐ 







  
  
    Great book for thin film XRD
  

*by Y***I on 12 August 2009*









  
  
    Because of the time limitation, I only read Chapter 6 for residual stress analysis, it was hard to follow at the beginning. After reading other reference papers and having better understanding about the theory, I read it again, I found the whole chapter was so well organized and I extremely like "complexity of ladder" structure, it is a real smart way to describe a complex scientific problem layer by layer. I enjoyed this book a lot and plan to read through all of it.
  


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*Last updated: 2026-03-06*